26 results
Mechanisms of Cracking in Pure Magnesium During High Strain Rate Plastic Deformation
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1814-1816
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Advances in Beam-sensitive Sample Preparation and Observation
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2214-2215
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Millimeter-scale, Large Uniform Area Semiconductor Device Delayering for Physical Failure Analyses and Quality Control
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3184-3187
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 768-770
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Developments in sample preparation of advanced semiconductor devices from the bulk to nanometer-length scales
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1078-1080
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Developments in controlled environmental transfer for Li-based battery materials: From sample preparation to SEM investigation
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1844-1845
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
STEM-in-SEM highly deformed structure investigation with focus on electron-transparent specimen preparation
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1604-1607
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Strain measurements in industrial applications: A case study of solder bumps in semiconductor devices
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 788-790
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Alternative Post-FIB Polishing Using Low-Energy Argon Ion Milling to Prevent Grid Redeposition
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 426-429
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Optimal Specimen Preparation for Correlative Atom Probe Tomography and Electron Microscopy of Environmentally Sensitive Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2472-2474
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1982-1984
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Multi-length Scale Cryogenic Sample Preparation to Electron Microscopy of Battery Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3022-3024
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Elastic and Plastic Strain Measurement Using Electron Backscatter Diffraction Technique: The Influence of Sample Preparation
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 534-535
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Combining Emerging Sample Preparation Methods, SEM, and TEM Investigations for Microelectronics Device Characterization at Multiple Scales
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 688-689
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
EBSD and TEM Microstructural Studies of New Fuel Cladding in Generation IV Sodium-cooled Fast Nuclear Reactors
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2224-2225
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
- Published online by Cambridge University Press:
- 19 June 2017, pp. 782-793
- Print publication:
- August 2017
-
- Article
- Export citation
Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 12-13
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Quantification of Milling Rate and Reduction in Amorphous Damage using Low Energy, Small Spot, Argon Ion Milling for TEM Specimens prepared by FIB.
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 194-195
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue 2 / April 2013
- Published online by Cambridge University Press:
- 04 March 2013, pp. 470-478
- Print publication:
- April 2013
-
- Article
- Export citation
An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1012-1013
- Print publication:
- August 2004
-
- Article
- Export citation